WEKO3
アイテム
{"_buckets": {"deposit": "23b9c10d-e7f6-4bb5-9134-c72ec48012fd"}, "_deposit": {"created_by": 11, "id": "2090", "owners": [11], "pid": {"revision_id": 0, "type": "depid", "value": "2090"}, "status": "published"}, "_oai": {"id": "oai:kougei.repo.nii.ac.jp:00002090", "sets": ["278"]}, "author_link": ["3555", "3556"], "item_10002_biblio_info_7": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2020-06-30", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1", "bibliographicPageEnd": "28", "bibliographicPageStart": "25", "bibliographicVolumeNumber": "43", "bibliographic_titles": [{"bibliographic_title": "東京工芸大学工学部紀要"}, {"bibliographic_title": "The Academic Reports, the Faculty of Engineering, Tokyo Polytechnic University", "bibliographic_titleLang": "en"}]}]}, "item_10002_description_5": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "光導波路や活きた生物細胞の高精度定量計測のために、我々は複プリズムやウォラストンプリズムの横移動を用いた共通光路位相シフト干渉顕微鏡を開発してきた。この方法では、交通光路の構造から、除振台なしでの干渉計測が可能や、非常に高い位相計測の安定性と再現性をゆする。本研究では、このような特徴を活かし、システム誤差や位相シフト誤差の低減法を提案し、サブナノの位相計測再現性を実現した。", "subitem_description_type": "Abstract"}, {"subitem_description": "Several techniques are presented for improving the phase measurement accuracy of the common-path phase-shifting interference microscope. Experimental results for elimination of the system phase error using a subtraction procedure is shown. The residual RMS phase error smaller as λ/1000 corresponding to 0.6nm was achieved. Experimental results for measuring the refractive index distribution of polarization-maintaining optical fibers are presented to demonstrate the usefulness of the method.", "subitem_description_type": "Abstract"}]}, "item_10002_publisher_8": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "東京工芸大学工学部"}]}, "item_10002_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "03876055", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "陳, 軍"}, {"creatorName": "チン, グン", "creatorNameLang": "ja-Kana"}], "nameIdentifiers": [{"nameIdentifier": "3555", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Chen, Jun", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "3556", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2020-06-30"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "vol43-1-06.pdf", "filesize": [{"value": "2.5 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 2500000.0, "url": {"label": "vol43-1-06", "url": "https://kougei.repo.nii.ac.jp/record/2090/files/vol43-1-06.pdf"}, "version_id": "a3cba5e4-aec6-450e-b104-70fdb3257fb3"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "干渉顕微鏡", "subitem_subject_scheme": "Other"}, {"subitem_subject": "位相物体", "subitem_subject_scheme": "Other"}, {"subitem_subject": "位相シフト干渉法", "subitem_subject_scheme": "Other"}, {"subitem_subject": "高精度定量位相計測", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Improvement of the phase measurement accuracy of common-path phase-shifting interference microscope with a Fresnel biprism", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "departmental bulletin paper", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "複プリズムを用いた共通光路位相シフト干渉顕微鏡の高精度化の研究", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "複プリズムを用いた共通光路位相シフト干渉顕微鏡の高精度化の研究"}, {"subitem_title": "Improvement of the phase measurement accuracy of common-path phase-shifting interference microscope using a Fresnel biprism", "subitem_title_language": "en"}]}, "item_type_id": "10002", "owner": "11", "path": ["278"], "permalink_uri": "https://kougei.repo.nii.ac.jp/records/2090", "pubdate": {"attribute_name": "公開日", "attribute_value": "2020-06-30"}, "publish_date": "2020-06-30", "publish_status": "0", "recid": "2090", "relation": {}, "relation_version_is_last": true, "title": ["複プリズムを用いた共通光路位相シフト干渉顕微鏡の高精度化の研究"], "weko_shared_id": -1}
複プリズムを用いた共通光路位相シフト干渉顕微鏡の高精度化の研究
https://kougei.repo.nii.ac.jp/records/2090
https://kougei.repo.nii.ac.jp/records/20901ef1ee40-7808-47cd-abe5-011e5b69db2c
名前 / ファイル | ライセンス | アクション |
---|---|---|
vol43-1-06 (2.5 MB)
|
|
Item type | 紀要論文 / Departmental Bulletin Paper(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2020-06-30 | |||||
タイトル | ||||||
タイトル | 複プリズムを用いた共通光路位相シフト干渉顕微鏡の高精度化の研究 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Improvement of the phase measurement accuracy of common-path phase-shifting interference microscope using a Fresnel biprism | |||||
言語 | ||||||
言語 | jpn | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 干渉顕微鏡 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 位相物体 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 位相シフト干渉法 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 高精度定量位相計測 | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Improvement of the phase measurement accuracy of common-path phase-shifting interference microscope with a Fresnel biprism | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
著者 |
陳, 軍
× 陳, 軍× Chen, Jun |
|||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | 光導波路や活きた生物細胞の高精度定量計測のために、我々は複プリズムやウォラストンプリズムの横移動を用いた共通光路位相シフト干渉顕微鏡を開発してきた。この方法では、交通光路の構造から、除振台なしでの干渉計測が可能や、非常に高い位相計測の安定性と再現性をゆする。本研究では、このような特徴を活かし、システム誤差や位相シフト誤差の低減法を提案し、サブナノの位相計測再現性を実現した。 | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Several techniques are presented for improving the phase measurement accuracy of the common-path phase-shifting interference microscope. Experimental results for elimination of the system phase error using a subtraction procedure is shown. The residual RMS phase error smaller as λ/1000 corresponding to 0.6nm was achieved. Experimental results for measuring the refractive index distribution of polarization-maintaining optical fibers are presented to demonstrate the usefulness of the method. | |||||
書誌情報 |
東京工芸大学工学部紀要 en : The Academic Reports, the Faculty of Engineering, Tokyo Polytechnic University 巻 43, 号 1, p. 25-28, 発行日 2020-06-30 |
|||||
出版者 | ||||||
出版者 | 東京工芸大学工学部 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 03876055 |