{"created":"2023-06-20T13:23:07.054148+00:00","id":35,"links":{},"metadata":{"_buckets":{"deposit":"f526fe82-a47d-4ca2-b137-83d79da2360b"},"_deposit":{"created_by":3,"id":"35","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"35"},"status":"published"},"_oai":{"id":"oai:kougei.repo.nii.ac.jp:00000035","sets":["12:17:22:23"]},"author_link":["59","60"],"item_2_biblio_info_12":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1981","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"23","bibliographicPageStart":"18","bibliographicVolumeNumber":"4","bibliographic_titles":[{"bibliographic_title":"東京工芸大学工学部紀要"},{"bibliographic_title":"The Academic Reports, the Faculty of Engineering, Tokyo Polytechnic University","bibliographic_titleLang":"en"}]}]},"item_2_description_11":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"Two types of testing methods of accurate optical Plates are proposed and experimentally examined. They are developed in connection with Fabry-Perot etalons which are used as a monochrometer in Brillouin scattering experiment. Parallelism and relative flatness of etalons are defined so that they are independent quantities each other. The first method proposed is a PhotograPhic testing one with a multilens and it is shown that this system can determine the relative flatness to an accuracy of about λ/1000, here λ=6328A. The second method is a pressure scanning and photoelectrc detection method using a multilens and a microcomputer. The accuracy obtained by this system is higher than the accuracy obtained by the photographic method.","subitem_description_type":"Other"}]},"item_2_description_15":{"attribute_name":"表示順","attribute_value_mlt":[{"subitem_description":"5","subitem_description_type":"Other"}]},"item_2_description_16":{"attribute_name":"アクセション番号","attribute_value_mlt":[{"subitem_description":"KJ00001511875","subitem_description_type":"Other"}]},"item_2_description_8":{"attribute_name":"記事種別(日)","attribute_value_mlt":[{"subitem_description":"論文","subitem_description_type":"Other"}]},"item_2_description_9":{"attribute_name":"記事種別(英)","attribute_value_mlt":[{"subitem_description":"Article","subitem_description_type":"Other"}]},"item_2_source_id_1":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00159741","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_19":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"03876055","subitem_source_identifier_type":"ISSN"}]},"item_2_text_6":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"東京工芸大学工学部写真工学科"}]},"item_2_title_3":{"attribute_name":"論文名よみ","attribute_value_mlt":[{"subitem_title":"チョウセイミツコウガクヘイメン ノ ヘイメンド ノ ソクテイ"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"伊藤, 進一"},{"creatorName":"イトウ, シンイチ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"59","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ITO, Shin-ichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"60","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-04-21"}],"displaytype":"detail","filename":"KJ00001511875.pdf","filesize":[{"value":"365.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00001511875.pdf","url":"https://kougei.repo.nii.ac.jp/record/35/files/KJ00001511875.pdf"},"version_id":"46015d8e-5c7a-47dc-a371-b195a9229eb5"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"超精密光学平面の平面度の測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"超精密光学平面の平面度の測定"},{"subitem_title":"Accurate Testing Methods of Optical Plates","subitem_title_language":"en"}]},"item_type_id":"2","owner":"3","path":["23"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-21"},"publish_date":"2017-04-21","publish_status":"0","recid":"35","relation_version_is_last":true,"title":["超精密光学平面の平面度の測定"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T14:26:07.204269+00:00"}