{"created":"2023-06-20T13:23:06.971412+00:00","id":34,"links":{},"metadata":{"_buckets":{"deposit":"838eef82-964c-485c-b2f0-32f5d527a728"},"_deposit":{"created_by":3,"id":"34","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"34"},"status":"published"},"_oai":{"id":"oai:kougei.repo.nii.ac.jp:00000034","sets":["12:17:22:23"]},"author_link":["57","56","58","55"],"item_2_biblio_info_12":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1981","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"17","bibliographicPageStart":"9","bibliographicVolumeNumber":"4","bibliographic_titles":[{"bibliographic_title":"東京工芸大学工学部紀要"},{"bibliographic_title":"The Academic Reports, the Faculty of Engineering, Tokyo Polytechnic University","bibliographic_titleLang":"en"}]}]},"item_2_description_11":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"An automatic measurement system of the photometric ellipsometer combined with microcomputer is described, which has been designed for the measurements of the Optical constants of the evaporated films and the bulk surfaces. The ellipsometer is of the rotating-analyser type ; it is capable of determining the ellipsometric parameters, in typical cases to δψ=0.1° and δΔ=0.1°. It takes about 1.5 minutes to accomplish the measuremet. We developed new measurement method which does not need the accurate alignment of the optical components before measurement. By carring out the measurements at two 90 degree different azimuths of the polariser, we can determine p, s directions of the optical system and the ellipsometric parameters at a time. It is also applied to the new alignment procedure which is more simpler and accurate than usual methods. The versatility of this new measurement method has been confirmed experimentally.","subitem_description_type":"Other"}]},"item_2_description_15":{"attribute_name":"表示順","attribute_value_mlt":[{"subitem_description":"4","subitem_description_type":"Other"}]},"item_2_description_16":{"attribute_name":"アクセション番号","attribute_value_mlt":[{"subitem_description":"KJ00001511874","subitem_description_type":"Other"}]},"item_2_description_8":{"attribute_name":"記事種別(日)","attribute_value_mlt":[{"subitem_description":"論文","subitem_description_type":"Other"}]},"item_2_description_9":{"attribute_name":"記事種別(英)","attribute_value_mlt":[{"subitem_description":"Article","subitem_description_type":"Other"}]},"item_2_source_id_1":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00159741","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_19":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"03876055","subitem_source_identifier_type":"ISSN"}]},"item_2_text_6":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"東京工芸大学工学部物性工学研究室"},{"subitem_text_value":"東京工芸大学工学部写真工学科"}]},"item_2_title_3":{"attribute_name":"論文名よみ","attribute_value_mlt":[{"subitem_title":"マイクロコンピューター ヲ モチイタ コウデンソッコウガタ ヘンコウカイセキソウチ ノ シサク"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"川畑, 州一"},{"creatorName":"カワバタ, シュウイチ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"55","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"猪瀬, 博昭"},{"creatorName":"イノセ, ヒロアキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"56","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"KAWABATA, Shuichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"57","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"INOSE, Hiroaki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"58","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-04-21"}],"displaytype":"detail","filename":"KJ00001511874.pdf","filesize":[{"value":"790.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00001511874.pdf","url":"https://kougei.repo.nii.ac.jp/record/34/files/KJ00001511874.pdf"},"version_id":"c9c20a42-1ac1-41b8-8e8e-0eef6e418622"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"マイクロコンピューターを用いた光電測光型偏光解析装置の試作","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"マイクロコンピューターを用いた光電測光型偏光解析装置の試作"},{"subitem_title":"Photometric Ellipsometer Combined with Micro-computer","subitem_title_language":"en"}]},"item_type_id":"2","owner":"3","path":["23"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-21"},"publish_date":"2017-04-21","publish_status":"0","recid":"34","relation_version_is_last":true,"title":["マイクロコンピューターを用いた光電測光型偏光解析装置の試作"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T14:26:08.829462+00:00"}