{"created":"2023-06-20T13:23:21.469472+00:00","id":253,"links":{},"metadata":{"_buckets":{"deposit":"6c25b6df-2301-444e-b221-b9b34ee1b381"},"_deposit":{"created_by":3,"id":"253","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"253"},"status":"published"},"_oai":{"id":"oai:kougei.repo.nii.ac.jp:00000253","sets":["12:17:52:53"]},"author_link":["658","652","653","657","654","659","656","655"],"item_2_biblio_info_12":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1995","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"27","bibliographicPageStart":"17","bibliographicVolumeNumber":"18","bibliographic_titles":[{"bibliographic_title":"東京工芸大学工学部紀要"},{"bibliographic_title":"The Academic Reports, the Faculty of Engineering, Tokyo Polytechnic University","bibliographic_titleLang":"en"}]}]},"item_2_description_11":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"Polarization measurement system using a rotating analyzer is analyzed for well understanding of polarization phenomena. Principle of the polarization measurement using Jones matrix, rotating analyzer and optical scanning methods is well explained. The method is applied to half and quarter wave plates whose principal axes are rotated. The amplitude ratio angle α, the phase difference δ, the azimuth angle φ and the ellipticity angle χ of an ellipse of polarization afe derived theoretically in cases of the wave plates rotated. The theoretical values of them are plotted in graphs and displayed as trajectories on Poincare' spheres. A simplified experimental setup is shown and experimental results are also given.","subitem_description_type":"Other"}]},"item_2_description_15":{"attribute_name":"表示順","attribute_value_mlt":[{"subitem_description":"5","subitem_description_type":"Other"}]},"item_2_description_16":{"attribute_name":"アクセション番号","attribute_value_mlt":[{"subitem_description":"KJ00001512028","subitem_description_type":"Other"}]},"item_2_description_8":{"attribute_name":"記事種別(日)","attribute_value_mlt":[{"subitem_description":"論文","subitem_description_type":"Other"}]},"item_2_description_9":{"attribute_name":"記事種別(英)","attribute_value_mlt":[{"subitem_description":"Article","subitem_description_type":"Other"}]},"item_2_source_id_1":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00159741","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_19":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"03876055","subitem_source_identifier_type":"ISSN"}]},"item_2_text_6":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"東京工芸大学工学部光工学科"},{"subitem_text_value":"東京工芸大学工学部光工学科"},{"subitem_text_value":"東京工芸大学工学部光工学科"},{"subitem_text_value":"東京工芸大学工学部光工学科"}]},"item_2_title_3":{"attribute_name":"論文名よみ","attribute_value_mlt":[{"subitem_title":"ガクセイジッケン ノタメノ ケンコウシカイテンホウ ニヨル ヘンコウソクテイ"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"中楯, 末三"},{"creatorName":"ナカダテ, スエゾウ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"652","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石川, 和夫"},{"creatorName":"イシカワ, カズオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"653","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"畑田, 豊彦"},{"creatorName":"ハタダ, トヨヒコ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"654","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"一色, 真幸"},{"creatorName":"イッシキ, マサキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"655","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"NAKADATE, Suezou","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"656","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ISHIKAWA, Kazuo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"657","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"HATADA, Toyohiko","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"658","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ISSHIKI, Masaki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"659","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-04-21"}],"displaytype":"detail","filename":"KJ00001512028.pdf","filesize":[{"value":"690.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00001512028.pdf","url":"https://kougei.repo.nii.ac.jp/record/253/files/KJ00001512028.pdf"},"version_id":"45a427d7-23d4-40bd-8352-287d1f43e75f"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"学生実験のための検光子回転法による偏光測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"学生実験のための検光子回転法による偏光測定"},{"subitem_title":"Polarization measurement using a rotating analyzer for optics laboratory","subitem_title_language":"en"}]},"item_type_id":"2","owner":"3","path":["53"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-21"},"publish_date":"2017-04-21","publish_status":"0","recid":"253","relation_version_is_last":true,"title":["学生実験のための検光子回転法による偏光測定"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T14:21:59.261317+00:00"}