{"created":"2023-06-20T13:23:19.968808+00:00","id":228,"links":{},"metadata":{"_buckets":{"deposit":"bc8b9eee-2052-4d41-b5a3-07301bcf7a96"},"_deposit":{"created_by":3,"id":"228","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"228"},"status":"published"},"_oai":{"id":"oai:kougei.repo.nii.ac.jp:00000228","sets":["12:17:48:49"]},"author_link":["609","606","608","605","602","604","603","607"],"item_2_biblio_info_12":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1993","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"129","bibliographicPageStart":"120","bibliographicVolumeNumber":"16","bibliographic_titles":[{"bibliographic_title":"東京工芸大学工学部紀要"},{"bibliographic_title":"The Academic Reports, the Faculty of Engineering, Tokyo Polytechnic University","bibliographic_titleLang":"en"}]}]},"item_2_description_11":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"A constant photocurrent method (CPM) system is developed for characterization of narrow-gap semiconductor films such as hydrogenated amorphous germanium (a-Ge : H), in which optical absorption spectra extend to low photon energy and photocurrent is significantly low in S/N (signal to noise ratio). Sufficient care is taken to enhance light intensity at the low photon energy in an optical system. The whole system is controlled by a personal computer to detect the low photocurrent using large time-constant integration. An empirical relation between lamp voltage and photocurrent at a fixed wavelength is adopted to reduce a measuring time. It is claimed that a photoresponse of pyroelectric detector should be flat in wavelength in order to obtain accurate CPM spectra. Preliminary results for a-Ge : H are also described.","subitem_description_type":"Other"}]},"item_2_description_15":{"attribute_name":"表示順","attribute_value_mlt":[{"subitem_description":"12","subitem_description_type":"Other"}]},"item_2_description_16":{"attribute_name":"アクセション番号","attribute_value_mlt":[{"subitem_description":"KJ00001512003","subitem_description_type":"Other"}]},"item_2_description_8":{"attribute_name":"記事種別(日)","attribute_value_mlt":[{"subitem_description":"論文","subitem_description_type":"Other"}]},"item_2_description_9":{"attribute_name":"記事種別(英)","attribute_value_mlt":[{"subitem_description":"Article","subitem_description_type":"Other"}]},"item_2_source_id_1":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00159741","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_19":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"03876055","subitem_source_identifier_type":"ISSN"}]},"item_2_text_6":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"東京工芸大学工学部大学院電子工学科"},{"subitem_text_value":"東京工芸大学工学部電子工学科"},{"subitem_text_value":"東京工芸大学工学部電子工学科"},{"subitem_text_value":"東京工芸大学工学部電子工学科"}]},"item_2_title_3":{"attribute_name":"論文名よみ","attribute_value_mlt":[{"subitem_title":"テイコウシエネルギー オヨビ テイコウデンリュウ ニオケル ハンドウタイハクマク ノ CPMトクセイ ソクテイソウチ"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"盛, 偉秋"},{"creatorName":"モリ, エラアキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"602","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"西川, 泰央"},{"creatorName":"ニシカワ, ヤスオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"603","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鈴木, 英佐"},{"creatorName":"スズキ, エイスケ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"604","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"青木, 彪"},{"creatorName":"アオキ, タケシ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"605","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"SHENG, Wei-Qiu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"606","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"NISHIKAWA, Yasuo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"607","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"SUZUKI, Eisuke","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"608","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"AOKI, Takeshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"609","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-04-21"}],"displaytype":"detail","filename":"KJ00001512003.pdf","filesize":[{"value":"717.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00001512003.pdf","url":"https://kougei.repo.nii.ac.jp/record/228/files/KJ00001512003.pdf"},"version_id":"de2bcb38-62f6-48e0-9dee-5634fe544f4c"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"低光子エネルギー及び低光電流における半導体薄膜のCPM特性測定装置","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"低光子エネルギー及び低光電流における半導体薄膜のCPM特性測定装置"},{"subitem_title":"CPM System for Characterization of Semiconductor Films at Low Photocurrent and Low Photon Energy","subitem_title_language":"en"}]},"item_type_id":"2","owner":"3","path":["49"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-21"},"publish_date":"2017-04-21","publish_status":"0","recid":"228","relation_version_is_last":true,"title":["低光子エネルギー及び低光電流における半導体薄膜のCPM特性測定装置"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T14:22:26.379945+00:00"}