{"created":"2023-06-20T13:23:16.712969+00:00","id":174,"links":{},"metadata":{"_buckets":{"deposit":"21b65dd9-8c1c-4d2d-8da7-6f19028e9076"},"_deposit":{"created_by":3,"id":"174","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"174"},"status":"published"},"_oai":{"id":"oai:kougei.repo.nii.ac.jp:00000174","sets":["12:17:40:41"]},"author_link":["460","462","461","458","463","459"],"item_2_biblio_info_12":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1988","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"89","bibliographicPageStart":"86","bibliographicVolumeNumber":"11","bibliographic_titles":[{"bibliographic_title":"東京工芸大学工学部紀要"},{"bibliographic_title":"The Academic Reports, the Faculty of Engineering, Tokyo Polytechnic University","bibliographic_titleLang":"en"}]}]},"item_2_description_11":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"One gauge of the performance of electronic devices which require high staility is their frequency stability. Frequency stability can be expressed in two ways : in the time domain and in the frequency domain. Phase noise determines short-term stability in the frequency domain and is an essential factor in evaluating device performance. In this study, we evaluated the short-term frequency stability of high-stability oscillators by a phase noise measurement system. The phase noise of two Rb atomic oscillators were measured against a reference 5 MHz crystal oscillator using a HP 3048 A phase noise measurement system. The two atomic oscillators showed almost the same characteristics. Below a Fourier frequency of 10 MHz, the ohase noise of the oscillators was smaller during free running than under control.lt is considerd that the control applied for reducing the effect of aging of the crystal oscillator in the atomic oscillator increased the ohase noise in the low Fourier frequency range.","subitem_description_type":"Other"}]},"item_2_description_15":{"attribute_name":"表示順","attribute_value_mlt":[{"subitem_description":"12","subitem_description_type":"Other"}]},"item_2_description_16":{"attribute_name":"アクセション番号","attribute_value_mlt":[{"subitem_description":"KJ00001511945","subitem_description_type":"Other"}]},"item_2_description_8":{"attribute_name":"記事種別(日)","attribute_value_mlt":[{"subitem_description":"論文","subitem_description_type":"Other"}]},"item_2_description_9":{"attribute_name":"記事種別(英)","attribute_value_mlt":[{"subitem_description":"Article","subitem_description_type":"Other"}]},"item_2_source_id_1":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00159741","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_19":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"03876055","subitem_source_identifier_type":"ISSN"}]},"item_2_text_6":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"東京工芸大学工学部"},{"subitem_text_value":"東京工芸大学工学部"},{"subitem_text_value":"東京工芸大学工学部"}]},"item_2_title_3":{"attribute_name":"論文名よみ","attribute_value_mlt":[{"subitem_title":"Rbゲンシハッシンキ ノ イソウザツオン ノ ソクテイ"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"松田, 勲"},{"creatorName":"マツダ, イサオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"458","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐多, 知治"},{"creatorName":"サタ, トモジ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"459","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"西尾, 真次"},{"creatorName":"ニシオ, シンジ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"460","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"MATSUDA, Isao","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"461","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"SATA, Tomoji","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"462","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"NISHIO, Shinji","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"463","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-04-21"}],"displaytype":"detail","filename":"KJ00001511945.pdf","filesize":[{"value":"325.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00001511945.pdf","url":"https://kougei.repo.nii.ac.jp/record/174/files/KJ00001511945.pdf"},"version_id":"0ebc449c-2397-4242-8d38-8ae63f8bd8ab"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Rb原子発振器の位相雑音の測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Rb原子発振器の位相雑音の測定"},{"subitem_title":"Measurement of the Phase Noise of Rb Atomic Oscillators","subitem_title_language":"en"}]},"item_type_id":"2","owner":"3","path":["41"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-21"},"publish_date":"2017-04-21","publish_status":"0","recid":"174","relation_version_is_last":true,"title":["Rb原子発振器の位相雑音の測定"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T14:23:31.859102+00:00"}