{"created":"2023-06-20T13:24:40.854623+00:00","id":1439,"links":{},"metadata":{"_buckets":{"deposit":"8e639d0c-5132-4182-8648-291c16c9773b"},"_deposit":{"created_by":3,"id":"1439","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"1439"},"status":"published"},"_oai":{"id":"oai:kougei.repo.nii.ac.jp:00001439","sets":["12:209:213"]},"author_link":["2469","2468","2470","2467"],"item_2_biblio_info_12":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1998","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"115","bibliographicPageStart":"107","bibliographicVolumeNumber":"4","bibliographic_titles":[{"bibliographic_title":"東京工芸大学芸術学部紀要"},{"bibliographic_title":"Bulletin, Faculty of Arts, Tokyo Institute of Polytechnics","bibliographic_titleLang":"en"}]}]},"item_2_description_11":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"Electronic Devices has been geting more popular in our social life. On the other hand they have to be produced higher and more strict specification. Especially, the higher durability is required for electric communication equipments for satelit, underground and submarin, which have to endure as long as 20 years. In contrast, consumer-use equipments is less than 10 years. This is because the fomer is to be used under severer circumstances than the latter. We have frequently an obstacle to reliablity of heavy-duty electronic components. It is called \"Out-break of Metal Whisker.\" This reaction takes place on the surface of electro-plated components which have been left in the field for several years. These whiskers causes short-circuit damages. In this paper we show the results of analysis on damages caused by metal whiskere and propose prevention measures aganst such damages.","subitem_description_type":"Other"}]},"item_2_description_15":{"attribute_name":"表示順","attribute_value_mlt":[{"subitem_description":"15","subitem_description_type":"Other"}]},"item_2_description_16":{"attribute_name":"アクセション番号","attribute_value_mlt":[{"subitem_description":"KJ00000202352","subitem_description_type":"Other"}]},"item_2_description_8":{"attribute_name":"記事種別(日)","attribute_value_mlt":[{"subitem_description":"論文","subitem_description_type":"Other"}]},"item_2_description_9":{"attribute_name":"記事種別(英)","attribute_value_mlt":[{"subitem_description":"Paper","subitem_description_type":"Other"}]},"item_2_source_id_1":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN10507753","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_19":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13418696","subitem_source_identifier_type":"ISSN"}]},"item_2_text_6":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"東京工芸大学芸術学部基礎教育課程"},{"subitem_text_value":"群馬県工業試験場"}]},"item_2_text_7":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Division of Liberal Arts and Science, Faculty of Arts, Tokyo Polytechnic University"},{"subitem_text_language":"en","subitem_text_value":"Gumma-Pref. Industrial Technology Research Laboratory"}]},"item_2_title_3":{"attribute_name":"論文名よみ","attribute_value_mlt":[{"subitem_title":"デンシ ブヒン メッキ ヒマク ノ ウイスカー ハッセイ ショウガイ チョウサ ト ソノ タイサク ケンキュウ"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"川田, 淳一郎"},{"creatorName":"カワダ, ジュウイチロウ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"2467","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"長谷川, 毅"},{"creatorName":"ハセガワ, タケシ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"2468","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"KAWADA, Jun-ichiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"2469","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"HASEGAWA, Takeshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"2470","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-04-21"}],"displaytype":"detail","filename":"KJ00000202352.pdf","filesize":[{"value":"1.6 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00000202352.pdf","url":"https://kougei.repo.nii.ac.jp/record/1439/files/KJ00000202352.pdf"},"version_id":"a6350bfe-6dfc-4e7f-9127-03207f48319f"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"電子部品めっき皮膜のウイスカー発生障害調査とその対策研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電子部品めっき皮膜のウイスカー発生障害調査とその対策研究"},{"subitem_title":"The Study on the Damage caused by Metal Whisker on the Electro-plated Electronic Components","subitem_title_language":"en"}]},"item_type_id":"2","owner":"3","path":["213"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-21"},"publish_date":"2017-04-21","publish_status":"0","recid":"1439","relation_version_is_last":true,"title":["電子部品めっき皮膜のウイスカー発生障害調査とその対策研究"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T14:01:30.481374+00:00"}